Telecom News --

COMPRION launches new LTE Test (U)SIM

Paderborn, Germany, 30 July, 2010

COMPRION’s pioneering work in LTE development: COMPRION offers its first commercially available LTE Test (U)SIM.

After launching its first LTE combined handset test solution “COMPRION SIMfony LTE” in February 2010,
COMPRION now also offers an LTE Test (U)SIM following the latest 3GPP specifications.

All new LTE data fields up to Release 9 are included in the 256K/J Test (U)SIM. The card has implemented
three applications: a Test SIM, a Test USIM and a Test ISIM. The Test (U)SIM also supports the three voltage classes 1.8V, 3V and 5V.

The LTE Test (U)SIM supports the standardised “Resize” command to extend the size of a data field and
the “Create” command with which it is possible to create new data fields. The card’s flexibility and feature
range enable the user to comprehensively examine the functionality of an LTE mobile device without having
access to a live LTE network.

“The new LTE test card helps advancing LTE development and assures the correct interworking of mobile
phones and (U)SIM cards using the new LTE standard,” states Daniela Wittkamp, Test (U)SIM Product Manager at COMPRION.

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